WE-A5.1P.5
Intelligent Classification of SAR Images Integrating Target Scattering Characteristics
Zhishuang Lin, Danmeng Zhang, Jinxing Li, Min Zhang, Xidian University, China
Session:
Inverse Scattering and Imaging I Oral
Track:
AP-S: Propagation and Scattering
Location:
Room 207
Session Time:
Wed, 16 Jul, 13:20 - 17:00
Presentation Time:
Wed, 16 Jul, 14:40 - 15:00
Session Co-Chairs:
Okan Yurduseven, Queen's University Belfast and Francesca Vipiana, Politecnico di Torino
Presentation
Discussion
Session WE-A5.1P
WE-A5.1P.1: SVD-Based High Resolution Millimeter-Wave Radar Imaging at W-Band
Shahrokh Hamidi, M.R. Nezhad-Ahmadi, University of Waterloo, Canada
WE-A5.1P.2: Reconfigurable Metacavity Antenna-based Microwave Computational Imaging
Mengran Zhao, Okan Yurduseven, Queen's University Belfast, United Kingdom
WE-A5.1P.3: Optimized Localized Mode Selection Technique in Computational Microwave Imaging
Aobo Li, Mengran Zhao, Okan Yurduseven, Queen's University Belfast, United Kingdom
WE-A5.1P.4: Investigation of in-shell seeds MMW classification
Jérôme Lanteri, Ali Darwish, Laurent Brochier, Université Côte d'Azur, France; Francesca Vipiana, Politecnico di Torino, Italy; Claire Migliaccio, Université Côte d'Azur, France
WE-A5.1P.5: Intelligent Classification of SAR Images Integrating Target Scattering Characteristics
Zhishuang Lin, Danmeng Zhang, Jinxing Li, Min Zhang, Xidian University, China
WE-A5.1P.6: Millimeter-Wave Interferometric Measurement of the Angular Velocity of Moving Objects Using Active Noise Waveform Illumination
Jorge Colon-Berrios, Cory Hilton, Jeffrey Nanzer, Michigan State University, United States
WE-A5.1P.7: 3-D Near-Field Passive Radar Imaging Using Multiple Illumination Sources
Quanfeng Wang, Technical University of Munich, Germany; Mei Song Tong, Tongji University, China; Thomas Eibert, Technical University of Munich, Germany
WE-A5.1P.8: Fullwave-Guided Optical Proximity Correction Based on Distorted Born Iterative Method
Zekui Jia, Luis Gomez, Weng Cho Chew, Purdue University, United States; Austin Peng, Ronald Goossens, ASML, United States
WE-A5.1P.9: The Extraction of Dielectric Characteristics based on Millimeter-Wave Images
Sheng Wang, Tong Li, XinYi Nie, Chun Lin, Anyong Qing, School of electrical engineering, Southwest Jiaotong University, Chengdu, China, China; Yang Meng, Zeyu Kang, Chongqing University of Posts and Telecommunications, Chongqing, China, China
WE-A5.1P.10: Dual-Domain Post-Processing Procedure to Enhance Image Quality in Millimeter-Wave Imaging System
Sina Zeraatkar, Behnam Ghandi, Sobhan Dabidian, Zahra Kavehvash, Sharif University of Technology, Iran
Resources
No resources available.