IEEE AP-S/URSI 2025 || Ottawa, Canada || 13

TH-A5.2P: Scattering and Diffraction

Thu, 17 Jul, 13:20 - 17:00

Location: Room 211

Session Type: Oral

Track: AP-S: Propagation and Scattering

Thu, 17 Jul, 13:20 - 13:40

TH-A5.2P.1: Scatterer Information Estimation Method Using the Backward Transient Scattering Magnetic Field Components When a Line Source and an Observation Point are Situated at Different Positions

Keiji Goto, Toru Kawano, Tomoaki Toribe, The National Defense Academy of Japan, Japan

Thu, 17 Jul, 13:40 - 14:00

TH-A5.2P.2: Scatterer Information Estimation Method Using the Backward Transient Scattering Magnetic Field Components When a Line Source and an Observation Point are Situated at the Same Position

Toru Kawano, Keiji Goto, Thanate Kulphan, The National Defense Academy of Japan, Japan

Thu, 17 Jul, 14:00 - 14:20

TH-A5.2P.3: High Frequency Scattering Analysis of Vertically Polarized Plane Wave by Multi-Story Buildings

Cuong Manh BUI, Hiroshi SHIRAI, Chuo University, Japan

Thu, 17 Jul, 14:20 - 14:40

TH-A5.2P.4: Extension of Falconer´s Monostatic to Bistatic Equivalence Theorem with Respect to Reconfigurable Intelligent Surface Testing

Fabian T. Bette, Onur Kasap, Thomas M. Gemmer, Franz X. Muhr, Franz X. Röhrl, Hendrik Bartko, Benoit Derat, Rohde & Schwarz GmbH & Co. KG, Germany; Wilhelm Keusgen, Technical University Berlin, Germany

Thu, 17 Jul, 14:40 - 15:00

TH-A5.2P.5: Design of Metasurface Based on Scattering Cancellation for Wide-Angle RCS Reduction in Antenna

Toshiki Soma, Hiroshi Suenobu, Yasuhiro Nishioka, Yoshio Inasawa, Mitsubishi Electric Corporation, Japan

Coffee Break

Thu, 17 Jul, 15:20 - 15:40

TH-A5.2P.6: Analysis of RCS Measurement Accuracy using Amplifier in Non-Anechoic Chamber Environment

Cheongmin Lee, Sung-Geon Kim, Yonsei University, Korea (South); Ilyoung Oh, Dongyang Mirea University, Korea (South); Jungje Ha, Jong-Gwan Yook, Yonsei University, Korea (South)

Thu, 17 Jul, 15:40 - 16:00

TH-A5.2P.7: Broadband Metantenna for In-Band Co-Polarized and Cross-Polarized RCS Reduction Using Characteristic Mode Analysis

Jingwen Wang, Juntao Yang, Meihao Chen, Xiang Zhang, University of Science and Technology of China, China; Jun Ding, East China Normal University, China; Weidong Chen, Chang Chen, University of Science and Technology of China, China

Thu, 17 Jul, 16:00 - 16:20