Hisamatsu Nakano, Tomoki Abe, Hosei University, Japan

Zubin Cheng, Ziheng Zhou, Yuehe Ge, Fuzhou University, China; Zhizhang (David) Chen, Dalhousie University, Canada

Abas Sabouni, Wilkes University, United States

Rupa Laller, Mahesh P Abegaonkar, Ananjan Basu, Indian Institute of Technology, Delhi, India

Michail Anastasiadis, Ghaleb Saleh Ghaleb Al-Duhni, Abe Akhiyat, Satheesh Bojja Venkatakrishnan, John Volakis, Florida International University, United States

Nuri Yilmazer, Texas AM University-Kingsville, United States; Ignacio Gil, Raul Fernandez-Garcia, Mariam El Gharbi, Jamal Abounasr, Department of Electronic Engineering, Universitat Politecnica de Catalunya, Terrassa, Barcelona, Spain, Spain

Kanghyun Ryoo, Byeongjin Kim, Jungsuek Oh, Seoul National University, Korea (South)

Xinzhi Bo, Bowen Yuan, Southeast University, China; Yixin Tong, Army Engineering University, China; Zhenguo Liu, Southeast University, China

Anubhav Kumar, Shreya Pourush, Raghvendra Kumar Chaudhary, Indian Institute of Technology Kanpur, India, India