MO-A3.2A.3
PCB Substrate Dielectric Constant Evaluation in Quantum Dilution Refrigerator Environment
Duixian Liu, Young Kwark, IBM, United States
Session:
Electromagnetic Structures for Sensing and Measurement Oral
Track:
AP-S: Electromagnetics: Theory, Materials, and Education
Location:
Room 210
Session Time:
Mon, 14 Jul, 08:00 - 09:40
Presentation Time:
Mon, 14 Jul, 08:40 - 09:00
Session Co-Chairs:
Shubhendu Bhardwaj, University Of Nebraska Lincoln and Rafael Caldeirinha, Instituto de Telecomunicações
Presentation
Discussion
Session MO-A3.2A
MO-A3.2A.1: Performance of Hilbert-Curve Based Microwave Sensor for Non-destructive Testing of Composites
Vimal Kumar Chaudhary, Muhammad Zubair, Jalil Ur-Rehman Kazim, Muhammad Imran, Qammer Abbasi, University of Glasgow, United Kingdom
MO-A3.2A.2: Resonant Calibration-Free Permittivity Measurement for Non-Destructive Food Quality Inspection
Glaucio Ramos, André Simão, Federal University of São João del-Rei, Brazil; Sandro Gonçalves, CEFET/MG, Brazil; Stefânia Faria, Rafael Caldeirinha, Instituto de Telecomunicações, Portugal
MO-A3.2A.3: PCB Substrate Dielectric Constant Evaluation in Quantum Dilution Refrigerator Environment
Duixian Liu, Young Kwark, IBM, United States
MO-A3.2A.4: Impedance Interferometry for Temperature Sensing in High-Stress, High-Temperature Applications
Zecheng Li, Nathanial Matz, Joseph Turner, Ravi Saraf, Shubhendu Bhardwaj, University Of Nebraska Lincoln, United States
MO-A3.2A.5: Machine Learning-Assisted Identification of Suspicious Liquids Based on Wideband Antennas
Lingfeng Li, Jinglei Yong, Yunjing Zhang, Soochow University, China; Peng Li, Suzhou Weimu Intelligent System Co., Ltd., China; Meisong Tong, Tongji University, China
Resources
No resources available.