MO-A3.4A: Material Modelling and Characterization
Mon, 14 Jul, 08:00 - 09:40
Location: Room 211
Session Type: Oral
Session Chair: Magdy Iskander, University of Hawaii at Manoa
Track: AP-S: Electromagnetics: Theory, Materials, and Education
Mon, 14 Jul, 08:00 - 08:20

MO-A3.4A.1: Thin Films Complex Permittivity Simulation, Analysis, and Experimental Measurements
Magdy Iskander, Jill Nakatsu, Sunny Zhang, Zhengqing Yun, Yuanzhang Xiao, University of Hawaii at Manoa, United States
Mon, 14 Jul, 08:20 - 08:40

MO-A3.4A.2: Maxwell-Garnett as a Model for Structural Colors in Dense Silica Nanoparticle Film
Mitchell Semple, Audrey Picard-Lafond, Wendy-Julie Madore, Defence Research and Development Canada, Canada
Mon, 14 Jul, 08:40 - 09:00

MO-A3.4A.3: Effect of the Sample Thickness Uncertainty on Sub-THz Material Parameter Extraction with VNA Quasi-Optical Measurements
Alperen Sari, Dou Feng, Alex Bystrov, University of Birmingham, United Kingdom; Stephen M. Hanham, Imperial College London, United Kingdom; Costas Constantinou, Miguel Navarro-Cía, University of Birmingham, United Kingdom
Mon, 14 Jul, 09:00 - 09:20

MO-A3.4A.4: Complex Permittivity Measurement Method Using Board-Partitioned Waveguide for Soft Matters
Haoteng Ye, Zihan Cai, Huakang Chen, Ming Yu, Southern University of Science and Technology, China
Mon, 14 Jul, 09:20 - 09:40

MO-A3.4A.5: Compact Microwave Sensor For Dielectric Material Characterization
Ashwani Kumar, Laxmi ., Divya ., University of Delhi, India