MO-A3.4A.5

Thin Films Complex Permittivity Simulation, Analysis, and Experimental Measurements

Magdy Iskander, Jill Nakatsu, Sunny Zhang, Zhengqing Yun, Yuanzhang Xiao, University of Hawaii at Manoa, United States
Session:
Material Modelling and Characterization Oral
Track:
AP-S: Electromagnetics: Theory, Materials, and Education
Location:
Rogers Centre: Room 211
Session Time:
Mon, 14 Jul, 08:00 - 09:40
Presentation Time:
Mon, 14 Jul, 09:20 - 09:40
Session Chair:
Mitchell Semple, Defense Research and Development Canada
Presentation
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Discussion
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Session MO-A3.4A
MO-A3.4A.1: Maxwell-Garnett as a Model for Structural Colors in Dense Silica Nanoparticle Film
Mitchell Semple, Audrey Picard-Lafond, Wendy-Julie Madore, Defence Research and Development Canada, Canada
MO-A3.4A.2: Effect of the Sample Thickness Uncertainty on Sub-THz Material Parameter Extraction with VNA Quasi-Optical Measurements
Alperen Sari, Dou Feng, Alex Bystrov, University of Birmingham, United Kingdom; Stephen M. Hanham, Imperial College London, United Kingdom; Costas Constantinou, Miguel Navarro-Cía, University of Birmingham, United Kingdom
MO-A3.4A.3: Complex Permittivity Measurement Method Using Board-Partitioned Waveguide for Soft Matters
Haoteng Ye, Zihan Cai, Huakang Chen, Ming Yu, Southern University of Science and Technology, China
MO-A3.4A.4: Compact Microwave Sensor For Dielectric Material Characterization
Ashwani Kumar, Laxmi ., Divya ., University of Delhi, India
MO-A3.4A.5: Thin Films Complex Permittivity Simulation, Analysis, and Experimental Measurements
Magdy Iskander, Jill Nakatsu, Sunny Zhang, Zhengqing Yun, Yuanzhang Xiao, University of Hawaii at Manoa, United States
Resources
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